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author:

Li, Wenjian (Li, Wenjian.) [1] | Chen, Jinhuo (Chen, Jinhuo.) [2] (Scholars:陈金伙) | Cheng, Shuying (Cheng, Shuying.) [3] (Scholars:程树英) | Wang, Yongshun (Wang, Yongshun.) [4]

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Abstract:

Indium doped ZnS (ZnS:In) films were prepared on glass substrate using thermal evaporation technology. It was found that the structural, optical and electrical properties of ZnS:In films strongly depend on the substrate temperature (Ts). By X-ray diffraction (XRD), atomic force microscopy (AFM), transmittance spectroscopy, and electric performance measurements, the effect of Ts on ZnS:In film is studied in detail. It reveals that Ts has important effect on ZnS grain size, crystallinity, lattice disorder, etc., which further leads to the obvious influence on its optical and electrical performance. Under the optimized Ts, the performance, especially the conductivity, achieved in this work is far higher than that reported for other n-type ZnS films. © 2014 Chinese Institute of Electronics.

Keyword:

Atomic force microscopy Evaporation Indium Optical lattices Photoelectricity Substrates X ray diffraction Zinc sulfide

Community:

  • [ 1 ] [Li, Wenjian]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350108, China
  • [ 2 ] [Chen, Jinhuo]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350108, China
  • [ 3 ] [Cheng, Shuying]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350108, China
  • [ 4 ] [Wang, Yongshun]School of Electronic and Information, Lanzhou Jiaotong University, Lanzhou 730070, China

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Source :

Journal of Semiconductors

ISSN: 1674-4926

CN: 11-5781/TN

Year: 2014

Issue: 2

Volume: 35

4 . 8 0 0

JCR@2023

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 3

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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