Copper　Sulphide　thin　films　have　been　prepared　on　different　substrates　using　electrodeposition　technique.　X-ray　diffraction　analysis　showed　that　the　prepared　films　possess　polycrystalline in　nature　with　cubic　structure.　Microstructural　parameters　such　as　crystallite　size,　strain　and　dislocation　density　are　determined　using　X-ray　diffraction　data.　Film　composition　and　surface　morphology　have　been　analyzed　using　Scanning　electron　microscopy　and　Energy　dispersive　analysis　by　X-rays.　Optical　absorption　analysis　showed　that　the　prepared　films　possess　band　gap　value　in　the　range　between　2.2　and　2.4 eV　for　films　obtained　on　different　substrates.　©　2014,　Springer　Science+Business　Media　New　York.