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author:

Liu, Baiyi (Liu, Baiyi.) [1] | Chen, Wei (Chen, Wei.) [2] (Scholars:陈为) | Wang, Jinghui (Wang, Jinghui.) [3] (Scholars:汪晶慧) | Chen, Qingbin (Chen, Qingbin.) [4] (Scholars:陈庆彬)

Indexed by:

EI SCIE

Abstract:

Voltages across magnetic components of power converters are generally pulsewidth modulation (PWM) waveforms, whereas the parameters of present magnetic core loss models are often tested under sinusoidal excitation by most magnetic material manufacturers. This leads to a significant difference with a PWM excitation and then impacts the testing accuracy of inductor losses. A testing device, based on dc law, has been designed to generate different kinds of PWM waveforms, and a corresponding testing scheme is proposed to accurately measure total inductor losses of different inductances with high frequency PWM excitations. Finally, experiments have been conducted to verify the effectiveness and correctness of the proposed scheme. The results show that the proposed testing scheme can accurately test the total inductor loss. Moreover, the proposed loss model of the testing device is in exact agreement with the actual device's loss with the fitting error within 1%, ensuring the accuracy of the proposed testing scheme.

Keyword:

DC law device loss model inductor loss Inductors Loss measurement Magnetic cores Magnetic flux Magnetic losses Pulse width modulation pulsewidth modulation (PWM) excitation Testing

Community:

  • [ 1 ] [Liu, Baiyi]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 2 ] [Chen, Wei]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 3 ] [Wang, Jinghui]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 4 ] [Chen, Qingbin]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350108, Peoples R China

Reprint 's Address:

  • 陈为

    [Chen, Wei]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350108, Peoples R China

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Source :

IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS

ISSN: 0278-0046

Year: 2021

Issue: 5

Volume: 68

Page: 4457-4467

8 . 1 6 2

JCR@2021

7 . 5 0 0

JCR@2023

ESI Discipline: ENGINEERING;

ESI HC Threshold:105

JCR Journal Grade:1

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 9

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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