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author:

Xie, Nan (Xie, Nan.) [1] (Scholars:谢楠) | Zhu, Defeng (Zhu, Defeng.) [2] | Xu, Qifeng (Xu, Qifeng.) [3] | Tan, Qiao (Tan, Qiao.) [4]

Indexed by:

EI SCIE

Abstract:

To achieve linear measurement of electro-optic phase delay and improve the accuracy and measurement range of the optical voltage transducer (OVT), this paper proposes a linear phase delay detection method for an optical voltage transformer based on a strip S-wave plate. Using the strip S-wave plate, the phase delay can be directly converted into the displacement of the dark stripe of the strip spot, and the displacement is located by the dual-quadrant detector. Using the Jones matrix, we confirm the linear relationship between the position of the dark stripe and the phase delay, and propose a positioning method and error compensation scheme of the dark stripe and set up an experimental system to verify its performance. The experimental results show that the OVT realizes the measurement of the electro-optic phase delay; the measuring range of the phase delay is up to +/- 40 degrees, and the measurement error is less than 0.5%.

Keyword:

linear measurement optical voltage transducer S-wave plate the phase delay of electro-optic crystal

Community:

  • [ 1 ] [Xie, Nan]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350116, Fujian, Peoples R China
  • [ 2 ] [Zhu, Defeng]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350116, Fujian, Peoples R China
  • [ 3 ] [Xu, Qifeng]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350116, Fujian, Peoples R China
  • [ 4 ] [Tan, Qiao]Minjiang Univ, Coll Comp & Control Engn, Fuzhou 350116, Fujian, Peoples R China

Reprint 's Address:

  • 徐启峰

    [Xu, Qifeng]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350116, Fujian, Peoples R China

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Source :

MEASUREMENT SCIENCE AND TECHNOLOGY

ISSN: 0957-0233

Year: 2021

Issue: 8

Volume: 32

2 . 3 9 8

JCR@2021

2 . 7 0 0

JCR@2023

ESI Discipline: ENGINEERING;

ESI HC Threshold:105

JCR Journal Grade:2

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 1

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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