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author:

Li, Enlong (Li, Enlong.) [1] | Rao, Zhichao (Rao, Zhichao.) [2] | Wang, Xiumei (Wang, Xiumei.) [3] | Liu, Yaqian (Liu, Yaqian.) [4] | Yu, Rengjian (Yu, Rengjian.) [5] | Chen, Gengxu (Chen, Gengxu.) [6] | Chen, Huipeng (Chen, Huipeng.) [7] | Guo, Tailiang (Guo, Tailiang.) [8]

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EI

Abstract:

In this work, an effective method is proposed to enable spatial modulation of the stiffness of elastic substrate through selectively controlling the formation of cross-linked interpenetrating network (IPN). The IPN structure is locally growing on the monomer-injected elastomer through selective ultraviolet light exposure, and the Young's modulus of selected regions can be significantly enhanced by an order of magnitude. Further experiments and finite element analysis results demonstrate that the selective region exhibits 100% strain isolation characteristic. Finally, a metal oxide thin film transistor (MOTFT) array is integrated on the substrates exhibiting negligible performance variation under 100 % tensile strain and 500 tensile cycling. Our strategy opens up a promising way for fabrication of stretchable substrate. © 2021 IEEE.

Keyword:

Elastic moduli Fabrication Field effect transistors Flexible electronics Metals Stiffness Substrates Tensile strain Thin film circuits Thin films Thin film transistors

Community:

  • [ 1 ] [Li, Enlong]The National and Local United Engineering Lab of Flat Panel Display Technology, Institute of Optoelectronic Display, Fuzhou University, Fuzhou; 350002, China
  • [ 2 ] [Li, Enlong]Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou; 350100, China
  • [ 3 ] [Rao, Zhichao]The National and Local United Engineering Lab of Flat Panel Display Technology, Institute of Optoelectronic Display, Fuzhou University, Fuzhou; 350002, China
  • [ 4 ] [Rao, Zhichao]Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou; 350100, China
  • [ 5 ] [Wang, Xiumei]The National and Local United Engineering Lab of Flat Panel Display Technology, Institute of Optoelectronic Display, Fuzhou University, Fuzhou; 350002, China
  • [ 6 ] [Wang, Xiumei]Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou; 350100, China
  • [ 7 ] [Liu, Yaqian]The National and Local United Engineering Lab of Flat Panel Display Technology, Institute of Optoelectronic Display, Fuzhou University, Fuzhou; 350002, China
  • [ 8 ] [Liu, Yaqian]Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou; 350100, China
  • [ 9 ] [Yu, Rengjian]The National and Local United Engineering Lab of Flat Panel Display Technology, Institute of Optoelectronic Display, Fuzhou University, Fuzhou; 350002, China
  • [ 10 ] [Yu, Rengjian]Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou; 350100, China
  • [ 11 ] [Chen, Gengxu]The National and Local United Engineering Lab of Flat Panel Display Technology, Institute of Optoelectronic Display, Fuzhou University, Fuzhou; 350002, China
  • [ 12 ] [Chen, Gengxu]Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou; 350100, China
  • [ 13 ] [Chen, Huipeng]The National and Local United Engineering Lab of Flat Panel Display Technology, Institute of Optoelectronic Display, Fuzhou University, Fuzhou; 350002, China
  • [ 14 ] [Chen, Huipeng]Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou; 350100, China
  • [ 15 ] [Guo, Tailiang]The National and Local United Engineering Lab of Flat Panel Display Technology, Institute of Optoelectronic Display, Fuzhou University, Fuzhou; 350002, China
  • [ 16 ] [Guo, Tailiang]Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou; 350100, China

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Source :

IEEE Electron Device Letters

ISSN: 0741-3106

Year: 2021

Issue: 10

Volume: 42

Page: 1484-1487

4 . 8 1 6

JCR@2021

4 . 1 0 0

JCR@2023

ESI HC Threshold:105

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 11

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

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