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author:

Zhu, Zekun (Zhu, Zekun.) [1] | Zhou, Xiaochao (Zhou, Xiaochao.) [2] | Yang, Shunchuan (Yang, Shunchuan.) [3] | Chen, Zhizhang (Chen, Zhizhang.) [4]

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Abstract:

A single-source surface integral equation (SS-SIE) for transverse electric (TE) scattering from cylindrical multilayered objects is proposed in this article. By incorporating the differential surface admittance operator (DSAO) and recursively applying the surface equivalence theorem from innermost to outermost boundaries, an equivalent model with only electric current density on the outermost boundary can be obtained. In addition, an integration approach is proposed, where the small argument expansion of the Hankel function is used to evaluate the singular and nearly singular integrals. Compared with other SIEs, such as the Poggio-Miller-Chang-Harrington-Wu-Tsai (PMCHWT) formulation, the computational expenditure is reduced for multilayered structures because only a single source is needed on the outermost boundary. As shown in the numerical results, the proposed method generates only 19% of unknowns, uses 26% of memory, and requires 29% of the CPU time of the PMCHWT formulation. © 1963-2012 IEEE.

Keyword:

Computation theory Electromagnetic wave scattering Integral equations Magnetic resonance imaging Method of moments Numerical methods Surface scattering

Community:

  • [ 1 ] [Zhu, Zekun]School of Electronic and Information Engineering, Beihang University, Beijing, China
  • [ 2 ] [Zhou, Xiaochao]School of Electronic and Information Engineering, Beihang University, Beijing, China
  • [ 3 ] [Yang, Shunchuan]Research Institute for Frontier Science and the School of Electronic and Information Engineering, Beihang University, Beijing, China
  • [ 4 ] [Chen, Zhizhang]College of Physics and Information Engineering, Fuzhou University, Fuzhou, China
  • [ 5 ] [Chen, Zhizhang]Department of Electrical and Computer Engineering, Dalhousie University, Halifax; NS; B3H 4R2, Canada

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Source :

IEEE Transactions on Microwave Theory and Techniques

ISSN: 0018-9480

Year: 2021

Issue: 12

Volume: 69

Page: 5217-5227

4 . 3 8 1

JCR@2021

4 . 1 0 0

JCR@2023

ESI HC Threshold:105

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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