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author:

Fu, Ximing (Fu, Ximing.) [1] | El-Sankary, Kamal (El-Sankary, Kamal.) [2] | Ge, Yang (Ge, Yang.) [3] | Yin, Yadong (Yin, Yadong.) [4] (Scholars:阴亚东) | Truhachev, Dmitri (Truhachev, Dmitri.) [5]

Indexed by:

EI SCIE

Abstract:

In this brief, a blind background calibration technique for super-regenerative receivers (SRRs) is presented. The proposed calibration scheme is designed to help SRRs to maintain their high sensitivity and immunity to negative transconductance (-G(m)) variations under process-voltage- temperature (PVT) variations. Unlike the conventional foreground -G(m) variations calibration techniques that require interruption of the receiver input, the proposed calibration technique employs input signal statistics and does not require interruption of the input bit-stream for extraction of the errors. The proposed scheme is based on an adaptive algorithm that compares the probability distribution of the pseudorandom-input (PI) stream and the output of the super-regenerative oscillator (SRO) and forces them to coincide at the end of the calibration. The proposed technique is implemented using a mixed-signal detection circuit and a finite state machine (FSM) that drives an 8-bit successive approximation register (SAR) to adjust the compensation current in the SRO. The simulation results successfully verify the effectiveness and reliability of the proposed calibration technique and show significant improvements in terms of SRR sensitivity under different process corners.

Keyword:

blind calibration current steering DAC envelope detector offset cancelation PVT variations Super-regenerative receiver system offset

Community:

  • [ 1 ] [Fu, Ximing]Dalhousie Univ, Dept Elect & Comp Engn, Halifax, NS B3H 4R2, Canada
  • [ 2 ] [El-Sankary, Kamal]Dalhousie Univ, Dept Elect & Comp Engn, Halifax, NS B3H 4R2, Canada
  • [ 3 ] [Ge, Yang]Dalhousie Univ, Dept Elect & Comp Engn, Halifax, NS B3H 4R2, Canada
  • [ 4 ] [Truhachev, Dmitri]Dalhousie Univ, Dept Elect & Comp Engn, Halifax, NS B3H 4R2, Canada
  • [ 5 ] [Yin, Yadong]Fuzhou Univ, Sch Phys & Informat Engn, Fuzhou 350000, Fujian, Peoples R China

Reprint 's Address:

  • [Fu, Ximing]Dalhousie Univ, Dept Elect & Comp Engn, Halifax, NS B3H 4R2, Canada

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Source :

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS

ISSN: 1549-7747

Year: 2022

Issue: 2

Volume: 69

Page: 344-348

4 . 4

JCR@2022

4 . 0 0 0

JCR@2023

ESI Discipline: ENGINEERING;

ESI HC Threshold:66

JCR Journal Grade:2

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 3

SCOPUS Cited Count: 3

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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