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author:

Jing, Jipeng (Jing, Jipeng.) [1] | Lin, Lihua (Lin, Lihua.) [2] (Scholars:林丽华) | Yang, Kaiyu (Yang, Kaiyu.) [3] (Scholars:杨开宇) | Hu, Hailong (Hu, Hailong.) [4] (Scholars:胡海龙) | Guo, Tailiang (Guo, Tailiang.) [5] (Scholars:郭太良) | Li, Fushan (Li, Fushan.) [6] (Scholars:李福山)

Indexed by:

EI SCIE

Abstract:

Zinc oxide (ZnO) is widely used as an electron transport layer (ETL) in quantum dot light-emitting diodes (QLED) because of its advantages of appropriate energy level and the simple process at low temperature. However, its high conductivity and abundant surface defects have become essential factors limiting the development of QLED. Here, we employ sol-gel derived lithium (Li)-doped ZnO (LZO) film as an ETL for inverted red QLED to achieve low-cost and high-efficiency QLED. We show that the conduction band minimum, the density of oxygen defects and conductivity of ZnO can be tuned by Li-doping. Consequently, the red QLED with 3 wt% Li-doped ZnO ETL exhibit maximum external quantum efficiency (EQE) and current efficiency of 16.4% and 24.1 cd/A, respectively, which are about 1.3-fold greater than those of the device with ZnO ETL. The Li-doping in sol-gel derived ZnO provides a feasible strategy for low-cost and high-performance inverted QLEDs.

Keyword:

Doping Light-emitting diodes Quantum dot Sol-gel ZnO

Community:

  • [ 1 ] [Jing, Jipeng]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350106, Peoples R China
  • [ 2 ] [Lin, Lihua]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350106, Peoples R China
  • [ 3 ] [Yang, Kaiyu]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350106, Peoples R China
  • [ 4 ] [Hu, Hailong]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350106, Peoples R China
  • [ 5 ] [Guo, Tailiang]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350106, Peoples R China
  • [ 6 ] [Li, Fushan]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350106, Peoples R China

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Source :

ORGANIC ELECTRONICS

ISSN: 1566-1199

Year: 2022

Volume: 103

3 . 2

JCR@2022

2 . 7 0 0

JCR@2023

ESI Discipline: PHYSICS;

ESI HC Threshold:55

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 24

SCOPUS Cited Count: 24

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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