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author:

Hu, X. (Hu, X..) [1] | Cai, J. (Cai, J..) [2] | Ye, Y. (Ye, Y..) [3] | Chen, E. (Chen, E..) [4] (Scholars:陈恩果) | Sun, J. (Sun, J..) [5] (Scholars:孙捷) | Yan, Q. (Yan, Q..) [6] | Guo, T. (Guo, T..) [7] (Scholars:郭太良)

Indexed by:

Scopus PKU CSCD

Abstract:

The reduction in the display chip size of micro light emitting diode (Micro-LED) exerts a sidewall effect and consequently results in a decreased forward light extraction efficiency (LEE). The display chip structure of Micro-LED with high LEE still needs to be further studied. For this reason, an optimized model of GaN-based Micro-LED with high LEE is explored by leveraging the finite-difference time-domain method from a simulation perspective. Specifically, the initial laminated structure of GaN-based Micro-LED with vertical sidewalls is constructed, and the influence of the sidewall effect on LEE is analyzed quantitatively. Then, the impact of the position change of multiple-quantum-well active layer in Micro-LED on the light output effect is investigated, and Micro-LED structure models with different inclined sidewall angles are analyzed. The influence of the bottom reflective material on LEE is discussed, and the parameters of the preliminarily optimized GaN-based Micro-LED model are obtained. Finally, LEE is further improved by designing a top transmission grating, and the effects of period, height, and duty cycle on LEE are examined. The results show that the overall LEE of the optimized GaN-based Micro-LED is 2.42 times higher than that of the initial structure. © 2022, Chinese Lasers Press. All right reserved.

Keyword:

Distributed Bragg reflector Finite-difference time-domain method Grating Light extraction efficiency Micro light emitting diode Optoelectronics

Community:

  • [ 1 ] [Hu, X.]National & Local United Engineering Laboratory of Flat Panel Display Technology, College of Physics and Information Engineering, Fuzhou University, Fuzhou, 350108, China
  • [ 2 ] [Cai, J.]National & Local United Engineering Laboratory of Flat Panel Display Technology, College of Physics and Information Engineering, Fuzhou University, Fuzhou, 350108, China
  • [ 3 ] [Ye, Y.]National & Local United Engineering Laboratory of Flat Panel Display Technology, College of Physics and Information Engineering, Fuzhou University, Fuzhou, 350108, China
  • [ 4 ] [Chen, E.]National & Local United Engineering Laboratory of Flat Panel Display Technology, College of Physics and Information Engineering, Fuzhou University, Fuzhou, 350108, China
  • [ 5 ] [Chen, E.]Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China (Mindu Innovation Laboratory), Fuzhou, 350108, China
  • [ 6 ] [Sun, J.]National & Local United Engineering Laboratory of Flat Panel Display Technology, College of Physics and Information Engineering, Fuzhou University, Fuzhou, 350108, China
  • [ 7 ] [Sun, J.]Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China (Mindu Innovation Laboratory), Fuzhou, 350108, China
  • [ 8 ] [Yan, Q.]National & Local United Engineering Laboratory of Flat Panel Display Technology, College of Physics and Information Engineering, Fuzhou University, Fuzhou, 350108, China
  • [ 9 ] [Yan, Q.]Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China (Mindu Innovation Laboratory), Fuzhou, 350108, China
  • [ 10 ] [Guo, T.]National & Local United Engineering Laboratory of Flat Panel Display Technology, College of Physics and Information Engineering, Fuzhou University, Fuzhou, 350108, China
  • [ 11 ] [Guo, T.]Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China (Mindu Innovation Laboratory), Fuzhou, 350108, China

Reprint 's Address:

  • 陈恩果

    [Chen, E.]National & Local United Engineering Laboratory of Flat Panel Display Technology, China;;[Chen, E.]Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China (Mindu Innovation Laboratory)China

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Source :

光学学报

ISSN: 0253-2239

CN: 31-1252/O4

Year: 2022

Issue: 15

Volume: 42

1 . 6

JCR@2022

1 . 6 0 0

JCR@2023

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 6

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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