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author:

Jiao, Z (Jiao, Z.) [1] | Wu, MH (Wu, MH.) [2] (Scholars:吴明红) | Shi, LY (Shi, LY.) [3] | Li, Z (Li, Z.) [4] | Wang, YL (Wang, YL.) [5]

Indexed by:

SCIE PKU CSCD

Abstract:

TiO2 nanowires on Ti/SiO2/Si were prepared by Atomic Force Microscopy(AFM) anode oxidation. The effects of applied bias and duration on the formation TiO2 nanowires were discussed. The results show that the thickness of titanium oxide is inversely proportional to the square root of applied bias and duration.

Keyword:

anode oxidation atomic force microscopy nanowire TiO2

Community:

  • [ 1 ] Shanghai Univ, Shanghai Appl Radiat Inst, Shanghai 201800, Peoples R China

Reprint 's Address:

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Source :

CHINESE JOURNAL OF INORGANIC CHEMISTRY

ISSN: 1001-4861

CN: 32-1185/O6

Year: 2004

Issue: 11

Volume: 20

Page: 1325-1328

0 . 6

JCR@2004

0 . 8 0 0

JCR@2023

JCR Journal Grade:4

Cited Count:

WoS CC Cited Count: 1

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 4

Affiliated Colleges:

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