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author:

Chen, H. (Chen, H..) [1] | Zeng, Q. (Zeng, Q..) [2] | Zhu, Y. (Zhu, Y..) [3] | Wu, T. (Wu, T..) [4] | Fan, Y. (Fan, Y..) [5] | Guo, T. (Guo, T..) [6] | Hu, H. (Hu, H..) [7] | Li, F. (Li, F..) [8]

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Scopus

Abstract:

Zinc oxide nanoparticles (ZnO NPs) is widely used as electron transport layer material in quantum dot light-emitting diodes (QLED) due to its high carrier mobility, unique photoelectric properties and good stability. However, because ZnO has higher electron mobility than organic hole transport materials, the carrier transport is unbalanced. In addition, ZnO NPs has many surface defects, which is easy to capture electrons or holes, increasing the probability of non-radiative recombination. To solve these problems, we carefully selected an organic compound diallylamine (DAA) doping method to modify the surface of ZnO. DAA is found to not only reduce the quenching at the interface between ZnO and QD, but also regulate the energy level position to promote the carrier injection balance of QLED devices. Compared with control ZnO QLED, the external quantum efficiency (EQE) of the red QLED with DAA-modified ZnO NPs is significantly improved, the peak EQE of the devices increased by 21 % from 18.8 % to 23.6 %. respectively. It is a simple and economical solution for manufacturing high-performance QLED. Authors

Keyword:

diallylamine Electrons II-VI semiconductor materials Light emitting diodes Performance evaluation quantum dot light-emitting diodes Quantum dots Surface morphology Zinc oxide ZnO

Community:

  • [ 1 ] [Chen H.]College of Physics and Information Engineering, Fuzhou University, China
  • [ 2 ] [Zeng Q.]College of Physics and Information Engineering, Fuzhou University, China
  • [ 3 ] [Zhu Y.]School of Intelligent Manufacturing and Electronic Engineering, Wenzhou University of Technology, Wenzhou, China
  • [ 4 ] [Wu T.]College of Physics and Information Engineering, Fuzhou University, China
  • [ 5 ] [Guo T.]College of Physics and Information Engineering, Fuzhou University, China
  • [ 6 ] [Hu H.]College of Physics and Information Engineering, Fuzhou University, China
  • [ 7 ] [Li F.]College of Physics and Information Engineering, Fuzhou University, China

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Source :

IEEE Journal of the Electron Devices Society

ISSN: 2168-6734

Year: 2024

Volume: 12

Page: 1-1

2 . 0 0 0

JCR@2023

CAS Journal Grade:4

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ESI Highly Cited Papers on the List: 0 Unfold All

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Chinese Cited Count:

30 Days PV: 2

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