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author:

Huang, Jinru (Huang, Jinru.) [1] | Xu, Zhihong (Xu, Zhihong.) [2] (Scholars:许志红) | Du, Liwei (Du, Liwei.) [3]

Indexed by:

Scopus

Abstract:

A reconstruction method using experimental arc fault data to improve the testing efficiency of protection devices is introduced. By establishing an arc-current database and employing collaborative control of data and circuit feedback signals, the electronic load can be precisely regulated enabling arc fault currents to be reproduced in real-world circuits. To address the frequency mismatches caused by power frequency fluctuations, an adaptive correction control strategy is proposed to eliminate waveform distortions in the reconstructed arc current. Simulations and experiments confirmed the consistency between the arc data and reconstructed current signals, and the method's feasibility was further validated by testing six arc-fault protection devices from different manufacturers.

Keyword:

adaptive correction Arc discharges Arc fault Circuit faults database Databases Protection Resistors signal reconstruction Signal reconstruction Testing

Community:

  • [ 1 ] [Huang, Jinru]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 2 ] [Xu, Zhihong]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 3 ] [Du, Liwei]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 4 ] [Xu, Zhihong]Fuzhou Univ, Fujian Key Lab New Energy Generat & Power Convers, Fuzhou 350108, Peoples R China
  • [ 5 ] [Xu, Zhihong]Fuzhou Univ, Fujian Prov Univ Engn Res Ctr Smart Distribut Grid, Fuzhou 350108, Peoples R China

Reprint 's Address:

  • 许志红

    [Xu, Zhihong]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350108, Peoples R China;;[Xu, Zhihong]Fuzhou Univ, Fujian Key Lab New Energy Generat & Power Convers, Fuzhou 350108, Peoples R China;;[Xu, Zhihong]Fuzhou Univ, Fujian Prov Univ Engn Res Ctr Smart Distribut Grid, Fuzhou 350108, Peoples R China

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Source :

CHINESE JOURNAL OF ELECTRICAL ENGINEERING

ISSN: 2096-1529

Year: 2024

Issue: 4

Volume: 10

Page: 129-140

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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