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author:

Yu, Z. (Yu, Z..) [1] | Zhang, Z. (Zhang, Z..) [2] | Zhao, F. (Zhao, F..) [3] | Hu, J. (Hu, J..) [4] | Zhong, S. (Zhong, S..) [5] (Scholars:钟舜聪) | Ren, Z. (Ren, Z..) [6] (Scholars:任志英) | Wang, X. (Wang, X..) [7] | Dai, G. (Dai, G..) [8] | Weng, Q. (Weng, Q..) [9]

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Scopus

Abstract:

Diamond has the highest thermal conductivity and the highest hardness in nature, ultralow thermal expansion coefficient, becoming the typically fourth generation semiconductor. High-performance devices and chips stringently require atomic-level surface of diamond, i.e. surface roughness Sa <0.2 nm. This is a challenge to achieve atomic-level surface on the hardest diamond with ultrahigh chemical inertness. This review presents challenges, progresses and future directions of advanced atomic-level polishing for single crystal diamond. It includes chemical mechanical polishing, ion beam polishing, light-assisted polishing and plasma-assisted polishing. The review analyses the historical development, material removal mechanisms, advantages and disadvantages of these polishing methods. Traditional polishing based on classical mechanics faces challenges to garner atomic-level surface. Future directions of atomic-level polishing are necessary to develop novel polishing methods with hybrid energy fields, such as plasma, light and chemical fields, etc. Cross-scale coupling models of multi-physics fields need to be proposed to develop novel polishing methods, consisting of polishing setups, optimization of processing parameters, polishing pads and slurries. This review provides new insights to acquire atomic-level surface of diamond using advanced polishing methods for stakeholders in education, academia and industries. © 2025 Elsevier B.V.

Keyword:

Atomic-level polishing Chemical mechanical polishing Diamond Ion beam polishing Light-assisted polishing

Community:

  • [ 1 ] [Yu Z.]Cancer Hospital of Dalian University of Technology, Liaoning Cancer Hospital & Institute, State Key Laboratory of High-performance Precision Manufacturing, Dalian University of Technology, Dalian, 116024, China
  • [ 2 ] [Zhang Z.]Cancer Hospital of Dalian University of Technology, Liaoning Cancer Hospital & Institute, State Key Laboratory of High-performance Precision Manufacturing, Dalian University of Technology, Dalian, 116024, China
  • [ 3 ] [Zhao F.]Cancer Hospital of Dalian University of Technology, Liaoning Cancer Hospital & Institute, State Key Laboratory of High-performance Precision Manufacturing, Dalian University of Technology, Dalian, 116024, China
  • [ 4 ] [Hu J.]School of Optoelectronic Science and Engineering, Soochow University, Suzhou, 215021, China
  • [ 5 ] [Zhong S.]School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou, 350108, China
  • [ 6 ] [Ren Z.]School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou, 350108, China
  • [ 7 ] [Wang X.]Tianjin Key Laboratory of Aerospace Intelligent Equipment Technology, Tianjin Key Laboratory of Microgravity and Hypogravity Environment Simulation Technology, Tianjin Institute of Aerospace Mechanical and Electrical Equipment, Tianjin, 300301, China
  • [ 8 ] [Dai G.]Tianjin Key Laboratory of Aerospace Intelligent Equipment Technology, Tianjin Key Laboratory of Microgravity and Hypogravity Environment Simulation Technology, Tianjin Institute of Aerospace Mechanical and Electrical Equipment, Tianjin, 300301, China
  • [ 9 ] [Weng Q.]Fujian Weino CNC Co., Ltd, Fuzhou, 351111, China

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Source :

Surfaces and Interfaces

ISSN: 2468-0230

Year: 2025

Volume: 72

5 . 7 0 0

JCR@2023

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 6

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