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author:

Liu, Yang (Liu, Yang.) [1] | Zheng, Yuanhui (Zheng, Yuanhui.) [2] (Scholars:郑远辉) | Zhu, Yangbin (Zhu, Yangbin.) [3] | Ma, Fumin (Ma, Fumin.) [4] | Zheng, Xiaojing (Zheng, Xiaojing.) [5] | Yang, Kaiyu (Yang, Kaiyu.) [6] (Scholars:杨开宇) | Zheng, Xin (Zheng, Xin.) [7] | Xu, Zhongwei (Xu, Zhongwei.) [8] (Scholars:徐中炜) | Ju, Songman (Ju, Songman.) [9] | Zheng, Yueting (Zheng, Yueting.) [10] | Guo, Tailiang (Guo, Tailiang.) [11] (Scholars:郭太良) | Qian, Lei (Qian, Lei.) [12] | Li, Fushan (Li, Fushan.) [13] (Scholars:李福山)

Indexed by:

EI Scopus SCIE

Abstract:

Anticounterfeiting techniques based on physical unclonable functions exhibit great potential in security protection of extensive commodities from daily necessities to high-end products. Herein, we propose a facile strategy to fabricate an unclonable super micro fingerprint (SMFP) array by introducing in situ grown perovskite crystals for multilevel anticounterfeiting labels. The unclonable features are formed on the basis of the differential transportation of a microscale perovskite precursor droplet during the inkjet printing process, coupled with random crystallization and Ostwald ripening of perovskite crystals originating from their ion crystal property. Furthermore, the unclonable patterns can be readily tailored by tuning in situ crystallization conditions of the perovskite. Three-dimensional height information on the perovskite patterns are introduced into a security label and further transformed into structural color, significantly enhancing the capacity of anticounterfeiting labels. The SMFPs are characterized with tunable multilevel anticounterfeiting properties, including macroscale patterns, microscale unclonable pattern, fluorescent two-dimensional pattens, and colorful three-dimensional information.

Keyword:

anticounterfeiting fingerprint pattern inkjet printing Ostwald ripening perovskite

Community:

  • [ 1 ] [Liu, Yang]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350108, Peoples R China
  • [ 2 ] [Zhu, Yangbin]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350108, Peoples R China
  • [ 3 ] [Ma, Fumin]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350108, Peoples R China
  • [ 4 ] [Zheng, Xiaojing]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350108, Peoples R China
  • [ 5 ] [Yang, Kaiyu]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350108, Peoples R China
  • [ 6 ] [Zheng, Xin]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350108, Peoples R China
  • [ 7 ] [Xu, Zhongwei]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350108, Peoples R China
  • [ 8 ] [Ju, Songman]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350108, Peoples R China
  • [ 9 ] [Zheng, Yueting]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350108, Peoples R China
  • [ 10 ] [Guo, Tailiang]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350108, Peoples R China
  • [ 11 ] [Li, Fushan]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350108, Peoples R China
  • [ 12 ] [Zheng, Yuanhui]Fuzhou Univ, Coll Chem, Fuzhou 350108, Peoples R China
  • [ 13 ] [Qian, Lei]TCL Corp Res, Shenzhen 518067, Peoples R China

Reprint 's Address:

  • 李福山

    [Li, Fushan]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350108, Peoples R China

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Source :

ACS APPLIED MATERIALS & INTERFACES

ISSN: 1944-8244

Year: 2020

Issue: 35

Volume: 12

Page: 39649-39656

9 . 2 2 9

JCR@2020

8 . 5 0 0

JCR@2023

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:196

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 69

SCOPUS Cited Count: 72

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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