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author:

Zhang, Yongai (Zhang, Yongai.) [1] (Scholars:张永爱) | Wu, Chaoxing (Wu, Chaoxing.) [2] (Scholars:吴朝兴) | Zheng, Yong (Zheng, Yong.) [3] | Guo, Tailiang (Guo, Tailiang.) [4] (Scholars:郭太良)

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Abstract:

Patterned ZnO nanowires were successfully synthesized on ITO electrodes deposited on the glass substrate by using a simple thermal evaporation approach. The morphology, crystallinity and optical properties of ZnO nanowires were characterized by scanning electron microscopy, X-ray diffraction, energy dispersive X-ray and photoluminescence spectroscopy. Their field emission characteristics were also investigated. SEM images showed that the ZnO nanowires, with a diameter of 100-200 nm and length up to 5 μm, were highly uniform and well distributed on the linear ITO electrodes. The field emission measurement indicated that patterned ZnO nanowire arrays have a turn-on field of 1.6 V/μm at current density of 1 μA/cm2 and a threshold field of 4.92 V/μm at current density of 1 mA/cm2 at an emitter-anode gap of 700 μm. The current density rapidly reached 2.26 mA/cm2 at an applied field of 5.38 V/μm. The fluctuation of emission current was lower than 5% for 4.5 h. The low turn-on field, high current density and good stability of patterned ZnO nanowire arrays indicate that it is a promising candidate for field emission application. © 2012 Chinese Institute of Electronics.

Keyword:

Current density Electrodes Field emission Nanowires Optical properties Photoluminescence spectroscopy Scanning electron microscopy Substrates Thermal evaporation X ray diffraction Zinc oxide

Community:

  • [ 1 ] [Zhang, Yongai]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 2 ] [Wu, Chaoxing]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 3 ] [Zheng, Yong]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 4 ] [Guo, Tailiang]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China

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Source :

Journal of Semiconductors

ISSN: 1674-4926

CN: 11-5781/TN

Year: 2012

Issue: 2

Volume: 33

4 . 8 0 0

JCR@2023

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 30

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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