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author:

Yan, Y. (Yan, Y..) [1] | Yu, R. (Yu, R..) [2] | Gao, C. (Gao, C..) [3] | Sui, Y. (Sui, Y..) [4] | Deng, Y. (Deng, Y..) [5] | Chen, H. (Chen, H..) [6] | Guo, T. (Guo, T..) [7]

Indexed by:

Scopus CSCD

Abstract:

Interfacial engineering at the dielectric/semiconductor interface is highly crucial for fabricating organic field-effect transistors with high performance. In this study, a bilayer MXene/semiconductor configuration is introduced to fabricate a high-performance n-type transistor, where electrical charges are formed and modulated at the SiO2/semiconductor interface, and MXene nanosheets serve as the primary electrical charge channel due to their high mobility and long lateral size. The electrical performance is optimized by adjusting the degree of connectivity of the MXene nanosheets. The proposed MXene/poly{[N,N′-bis(2-octyl-do-decyl)-naphthalene-1,4,5,8-bis(dicarboximide)-2,6-diyl]-alt-5,5′-(2,2′-bithiophene)} (N2200) transistors show boosted n-type characteristics, including a 100-fold increase in field-effect mobility, a large ON/OFF ratio of 104, and a small subthreshold swing of 0.65 V dec−1, all of which are significantly improved compared with single-layer N2200 transistors. The high performance of the two-dimensional MXene nanochannel is due to its electronegativity and high mobility. The electronegativity significantly enhances electron transfer from N2200 to the MXene channel, where they are efficiently transported along the MXene channel. Interestingly, the MXene/p-type semiconductor transistors show suppressed p-type performance because of the highly negative MXene nanosheets. Additionally, the proposed bilayer MXene/n-type semiconductor configuration shows a good configuration generality and improved performance. These findings demonstrate the feasibility of fabricating high-performance n-type transistors using a bilayer MXene/semiconductor combination. [Figure not available: see fulltext.]. © 2022, Science China Press and Springer-Verlag GmbH Germany, part of Springer Nature.

Keyword:

bilayer stack electronegativity MXene n-type organic thin-film transistor

Community:

  • [ 1 ] [Yan, Y.]Institute of Optoelectronic Display, National & Local United EngineeringLab of Flat Panel Display Technology, Fuzhou University, Fuzhou, 350002, China
  • [ 2 ] [Yan, Y.]Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou, 350100, China
  • [ 3 ] [Yan, Y.]School of Materials Science and Engineering, Xiamen University of Technology, Xiamen, 361024, China
  • [ 4 ] [Yu, R.]Institute of Optoelectronic Display, National & Local United EngineeringLab of Flat Panel Display Technology, Fuzhou University, Fuzhou, 350002, China
  • [ 5 ] [Yu, R.]Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou, 350100, China
  • [ 6 ] [Gao, C.]Institute of Optoelectronic Display, National & Local United EngineeringLab of Flat Panel Display Technology, Fuzhou University, Fuzhou, 350002, China
  • [ 7 ] [Gao, C.]Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou, 350100, China
  • [ 8 ] [Sui, Y.]School of Materials Science and Engineering, Tianjin University, Tianjin, 300072, China
  • [ 9 ] [Deng, Y.]School of Materials Science and Engineering, Tianjin University, Tianjin, 300072, China
  • [ 10 ] [Chen, H.]Institute of Optoelectronic Display, National & Local United EngineeringLab of Flat Panel Display Technology, Fuzhou University, Fuzhou, 350002, China
  • [ 11 ] [Chen, H.]Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou, 350100, China
  • [ 12 ] [Guo, T.]Institute of Optoelectronic Display, National & Local United EngineeringLab of Flat Panel Display Technology, Fuzhou University, Fuzhou, 350002, China
  • [ 13 ] [Guo, T.]Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou, 350100, China

Reprint 's Address:

  • [Chen, H.]Institute of Optoelectronic Display, China

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Source :

Science China Materials

ISSN: 2095-8226

Year: 2022

Issue: 11

Volume: 65

Page: 3087-3095

8 . 1

JCR@2022

6 . 8 0 0

JCR@2023

ESI HC Threshold:91

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 15

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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