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author:

Liu, Q. (Liu, Q..) [1] | Huang, Z. (Huang, Z..) [2] | Xie, J. (Xie, J..) [3] | Liu, X. (Liu, X..) [4] | Zou, J. (Zou, J..) [5]

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Scopus

Abstract:

Permutation polynomials with low c-differential uniformity and boomerang uniformity have wide applications in cryptography. In this paper, by utilizing the Weil sums technique and solving some certain equations over F2, we determine the c-differential uniformity and boomerang uniformity of these permutation polynomials: (1) f1(x)=x+Tr1n(x2+x3+x+ux), where n=2k+1, u∈F2 with Tr1n(u)=1; (2) f2(x)=x+Tr1n(x2+(x+1)2), where n=2k+1; (3) f3(x)=x−1+Tr1n((x−1+1)d+x−d), where n is even and d is a positive integer. The results show that the involutions f1(x) and f2(x) are APcN functions for c∈F2﹨{0,1}. Moreover, the boomerang uniformity of f1(x) and f2(x) can attain 2n. Furthermore, we generalize some previous works and derive the upper bounds on the c-differential uniformity and boomerang uniformity of f3(x). © 2023 Elsevier Inc.

Keyword:

Boomerang uniformity C-differential uniformity Permutation polynomial

Community:

  • [ 1 ] [Liu Q.]College of Computer and Data Science, Fuzhou University, Fuzhou, 350116, China
  • [ 2 ] [Liu Q.]Key Laboratory of Information Security of Network Systems, Fuzhou University, Fuzhou, 350116, China
  • [ 3 ] [Huang Z.]College of Computer and Data Science, Fuzhou University, Fuzhou, 350116, China
  • [ 4 ] [Huang Z.]Key Laboratory of Information Security of Network Systems, Fuzhou University, Fuzhou, 350116, China
  • [ 5 ] [Xie J.]Independent researcher, No. 2800 Chuangxin Avenue, Hefei, 230088, China
  • [ 6 ] [Liu X.]College of Computer and Data Science, Fuzhou University, Fuzhou, 350116, China
  • [ 7 ] [Liu X.]Key Laboratory of Information Security of Network Systems, Fuzhou University, Fuzhou, 350116, China
  • [ 8 ] [Zou J.]College of Computer and Data Science, Fuzhou University, Fuzhou, 350116, China
  • [ 9 ] [Zou J.]Key Laboratory of Information Security of Network Systems, Fuzhou University, Fuzhou, 350116, China

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Source :

Finite Fields and their Applications

ISSN: 1071-5797

Year: 2023

Volume: 89

1 . 2

JCR@2023

1 . 2 0 0

JCR@2023

ESI HC Threshold:13

JCR Journal Grade:1

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 4

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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