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author:

Lin, Heng (Lin, Heng.) [1] | Liu, Yang (Liu, Yang.) [2] | Hu, Hailong (Hu, Hailong.) [3] (Scholars:胡海龙) | Guo, Tailiang (Guo, Tailiang.) [4] (Scholars:郭太良) | Li, Fushan (Li, Fushan.) [5] (Scholars:李福山)

Indexed by:

EI Scopus SCIE

Abstract:

Quantum dot (QD) light-emitting diodes (QLEDs) have become one of the primary development directions for next-generation display techniques due to their excellent optoelectronic and solution-processing properties. High-performance QLEDs rely on high-quality light-emitting layers that are mainly stacked QD films deposited by spin-coating (SC). However, preparing large-area and defect-free monolayer films, which is crucial for high-quality displays, is the inherent drawback of the SC technique and is still challenging. Herein, we propose an in-situ defect-repairing strategy to create defect-passivating monolayer QD films at a liquid/air interface by a simple injection assembly (IA) technique. The monolayer QD film was assembled and passivated by a simple n-butyl-amine injection into ethylene glycol (EG), prompting the IA-QLEDs to exhibit excellent electrical performance. The as-fabricated IA-QLEDs outperform conventional SC-QLEDs with EQEs exceeding 24 % and significantly extended lifetimes. Furthermore, our method demonstrated its scalability (a defect-free 7x5 cm2 monolayer is fabricated), enabling the fabrication of large-area QD films with uniform morphology through a straightforward expansion of the film-forming container. This work proposes a general strategy for interfacial film formation and defect repair of QD film and holds significant promise for the practical application of high-performance QLEDs.

Keyword:

Film defects repairing Interface assembly Monolayer film Quantum dot light-emitting diodes

Community:

  • [ 1 ] [Lin, Heng]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350116, Peoples R China
  • [ 2 ] [Liu, Yang]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350116, Peoples R China
  • [ 3 ] [Hu, Hailong]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350116, Peoples R China
  • [ 4 ] [Guo, Tailiang]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350116, Peoples R China
  • [ 5 ] [Li, Fushan]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350116, Peoples R China
  • [ 6 ] [Liu, Yang]Fujian Normal Univ, Strait Inst Flexible Elect SIFE, Future Technol, Fuzhou 350117, Peoples R China
  • [ 7 ] [Lin, Heng]Fujian Sci & Technol Innovat Lab Optoelect Informa, Fuzhou 350108, Peoples R China
  • [ 8 ] [Hu, Hailong]Fujian Sci & Technol Innovat Lab Optoelect Informa, Fuzhou 350108, Peoples R China
  • [ 9 ] [Guo, Tailiang]Fujian Sci & Technol Innovat Lab Optoelect Informa, Fuzhou 350108, Peoples R China
  • [ 10 ] [Li, Fushan]Fujian Sci & Technol Innovat Lab Optoelect Informa, Fuzhou 350108, Peoples R China

Reprint 's Address:

  • [Liu, Yang]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350116, Peoples R China;;[Li, Fushan]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350116, Peoples R China;;[Liu, Yang]Fujian Normal Univ, Strait Inst Flexible Elect SIFE, Future Technol, Fuzhou 350117, Peoples R China;;

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Source :

CHEMICAL ENGINEERING JOURNAL

ISSN: 1385-8947

Year: 2023

Volume: 480

1 3 . 4

JCR@2023

1 3 . 4 0 0

JCR@2023

JCR Journal Grade:1

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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