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author:

Zhu, Yangbin (Zhu, Yangbin.) [1] | Hu, Hailong (Hu, Hailong.) [2] (Scholars:胡海龙) | Liu, Yang (Liu, Yang.) [3] | Chen, Maoshen (Chen, Maoshen.) [4] | Lin, Wanzhen (Lin, Wanzhen.) [5] | Ye, Yun (Ye, Yun.) [6] (Scholars:叶芸) | Guo, Tailiang (Guo, Tailiang.) [7] (Scholars:郭太良) | Li, Fushan (Li, Fushan.) [8] (Scholars:李福山)

Indexed by:

EI Scopus SCIE

Abstract:

We report here the all-solution-processed, high-efficiency quantum dot light emitting diode (QLED) employing inorganic copper (I) thiocyanate (CuSCN) as hole injection layer. In comparison with the widely used injection material of poly(3,4-ethylenedioxythiophene): poly(styrene sulfonate) (PEDOT:PSS), the hole injection into the QD layer is significantly improved, allowing low turn-on voltage, high luminance and efficiency. By optimizing the multilayer structure and synergistically balancing the carrier injection, the resulting OLEDs exhibit high performance with the maximum current efficiency of 52.4 cd/A and external quantum efficiency of 12.0% for green device, 17.0 cd/A and 16.2% for red device. These results indicate that CuSCN is a reliable hole transport materials for low-cost, high-efficiency QLED devices.

Keyword:

All-solution-processed Copper (I) thiocyanate Light-emitting diodes Quantum dots

Community:

  • [ 1 ] [Zhu, Yangbin]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350116, Fujian, Peoples R China
  • [ 2 ] [Hu, Hailong]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350116, Fujian, Peoples R China
  • [ 3 ] [Liu, Yang]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350116, Fujian, Peoples R China
  • [ 4 ] [Chen, Maoshen]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350116, Fujian, Peoples R China
  • [ 5 ] [Ye, Yun]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350116, Fujian, Peoples R China
  • [ 6 ] [Guo, Tailiang]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350116, Fujian, Peoples R China
  • [ 7 ] [Li, Fushan]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350116, Fujian, Peoples R China
  • [ 8 ] [Lin, Wanzhen]Fuzhou Univ, MOE Key Lab Analyt Sci Food Safety & Biol, Fuzhou 350116, Fujian, Peoples R China

Reprint 's Address:

  • 胡海龙 李福山

    [Hu, Hailong]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350116, Fujian, Peoples R China;;[Li, Fushan]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350116, Fujian, Peoples R China

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Source :

ORGANIC ELECTRONICS

ISSN: 1566-1199

Year: 2019

Volume: 70

Page: 279-285

3 . 3 1

JCR@2019

2 . 7 0 0

JCR@2023

ESI Discipline: PHYSICS;

ESI HC Threshold:138

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 18

SCOPUS Cited Count: 18

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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