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author:

Hong, Chunyan (Hong, Chunyan.) [1] | Ye, Yun (Ye, Yun.) [2] (Scholars:叶芸) | Guo, Fan (Guo, Fan.) [3] | Yan, Min (Yan, Min.) [4] | Jiang, Yadong (Jiang, Yadong.) [5] | Guo, Tailiang (Guo, Tailiang.) [6] (Scholars:郭太良)

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Abstract:

TiO2 nanotube arrays were fabricated by anodic oxidation of pure Ti plate in the HF solution. The impacts of the growth conditions on the microstructures and field emission characteristics of the TiO2 nanotube arrays were evaluated. The arrays were characterized with field emission scanning electron microscopy and X-ray photoelectron spectroscopy. The results show that the anodization voltage strongly affects the microstructures and emission properties of the TiO2 nano-tube arrays. For example, as the anodization voltage increased, its emission on-set voltage varied in a decrease-increase mode; and the tube diameter and length increased with little change in its wall thickness. The arrays, anodized at 10 V, were found to have the lowest onset field, 3.15 V/μm; and an emission current density of 0.85 mA/cm2, when biased at 8 V/μm. Moreover, high emission stability for at least 6 h was observed.

Keyword:

Anodic oxidation Field emission Field emission microscopes Microstructure Nanotubes Photoelectrons Titanium dioxide X ray photoelectron spectroscopy

Community:

  • [ 1 ] [Hong, Chunyan]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 2 ] [Ye, Yun]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 3 ] [Guo, Fan]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 4 ] [Yan, Min]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 5 ] [Jiang, Yadong]State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China
  • [ 6 ] [Guo, Tailiang]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China

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Source :

Journal of Vacuum Science and Technology

ISSN: 1672-7126

CN: 11-5177/TB

Year: 2013

Issue: 2

Volume: 33

Page: 141-145

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

Online/Total:177/10000577
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